MIL-STD-883 Testing

Compliant Quality Conformance Testing for MIL-STD-883

GROUP B TESTS

Class B and S Microcircuits

GROUP C TESTS

Life Tests

GROUP D TESTS

Package Related Tests

MECHANICAL TESTS

Devices are subjected to different destructive and non-destructive mechanical stresses including, but not limited to, vibration, twisting, and bending.

ENVIRONMENTAL TESTS

Devices are subjected to different varying environmental conditions. Including but not limited to, temperature, humidity, and barometric pressure.

GROUP B TESTS

For Class V (S) Devices

Subgroup 1

  • Physical Dimension
  • Vibration Variable Frequency

 

Subgroup 2

  • Resistance to Solvent
  • Internal Visual & Mechanical Bond Strength
  • Substrate Attach

 

Subgroup 3

  • Solderability

Subgroup 4

  • Fine Leak
  • Gross Leak
  • Lid Torque

 

Subgroup 5

  • Steady State Life

 

Subgroup 6

  • Temperature Cycle
  • Constant Acceleration
  • Fine Leak
  • Gross Leak

For Class Q (B) Devices

Subgroup 2

  • Resistance to Solvent

 

Subgroup 2

  • Solderability

 

Subgroup 3 

  • Bond Strength

GROUP C TESTS

Subgroup 1A

  • Steady-State life Test
    • TM 1005 45 (0) 1000 hours at 125℃
  • End-Point Electrical Parameters
    • as specified in applicable device procurement specification
 

GROUP D TESTS

Subgroup 1

  • Physical Dimension

 

Subgroup 2

  • Lead/Terminal Integrity Test
  • Fine Leak & Gross Leak
  • BGA/CGA Packages
  • Ball Shear test for BGA Package
  • Solder Column pull test for CGA Package

 

Subgroup 3 

  • Thermal Shock
  • Temperature Cycling
  • Moisture Resistance
  • Visual Examination
  • Fine Leak & Gross Leak
  • End-point Electrical Parameters

 

 Subgroup 4

  • Mechanical Shock
  • Vibration Variable Frequency
  • Constant Acceleration
  • Fine Leak & Gross Leak
  • Visual Examination
  • End-point Electrical Parameters

Subgroup 5

  • Salt Atmosphere
  • Visual Examination
  • Fine Leak
  • Gross Leak

 

Subgroup 6

  • Internal Water Vapor

 

Subgroup 7

  • Adhesion of Lead finish

 

Subgroup 8

  • Lid Torque

 

Subgroup 9

  • Soldering Heat
  • Fine Leak & Gross Leak
  • External Visual Examination
  • End-point Electrical

MECHANICAL TESTS

  • Constant Acceleration (Method 2001)
  • Mechanical Shock (Method 2002)
  • Solderability (Method 2003)
  • Lead Integrity (Method 2004)
  • Vibration Variable Frequency (Method 2007)
  • Bond Strength Destructive Bond Pull Test (Method 2011)
  • Resistance to Solvents (Method 2015)
  • Physical Dimensions (Method 2016)

ENVIRONMENTAL TESTS

  • Moisture Resistance (Method 1004)
  • Steady State Life (Method 1005)
  • Salt Atmosphere Corrosion (Method 1009)
  • Temperature Cycling (Method 1010)
  • Thermal Shock (Method 1011)
  • Seal  (Method 1014)
    •  Fine Leak
    • Gross Leak Test
  • Burn-In Test (Method 1015)
  • Internal Water Vapor Content (Method 1018)